Measurement of pure Kerr nonlinearity in GaN thin films at 800 nm by means of eclipsing Z-scan experiments
نویسندگان
چکیده
We report the measurement of Kerr nonlinearity of thin films of GaN by using the eclipsing Z-scan technique. The measurement was performed using 100 fs pulses at 800 nm. We measured a pure refractive signal, whose associated nonlinear Kerr coefficient was n2 = (−7.3 ± 0.4)× 10−14 cm2 W−1.
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